Windowed Fringe Pattern Analysis
Qian Kemao
This book provides solutions to the challenges involved in fringe pattern analysis, covering techniques for full-field, noncontact, and high-sensitivity measurement. The primary goal of fringe pattern analysis is to extract the hidden phase distributions that generally relate to the physical quantities being measured. Both theoretical analysis and algorithm development are covered to facilitate the work of researchers and engineers. The information presented is also appropriate as a specialized subject for students of optical and computer engineering.
Thể loại:
Năm:
2013
Nhà xuát bản:
SPIE Press
Ngôn ngữ:
english
Trang:
300
ISBN 10:
0819496413
ISBN 13:
9780819496416
Loạt:
SPIE Press Monograph PM239
File:
PDF, 19.40 MB
IPFS:
,
english, 2013